Teachers and Students of CQUST Participated in the 2020 ICHVE International Conference and Gave On-Site Reports

Release Time:2020-09-19 Author:Xu Zhiyuan Editor:Li Qing

The Seventh IEEE International Conference on High Voltage Engineering and Application (ICHVE 2020) was held online from Sept. 6 to 10. More than 500 experts and scholars from all over the world attended the conference online, including the research team led by Prof. Wei Gang from the School of Electrical Engineering, CQUST. Fu Wei and Bai Yichun, postgraduate students on the team presented research reports at the scene.

ICHVE, co-initiated by Pro. Sun Caixin and Grzybowsky, an authority in the field of international high voltage study, is a high-level international IEEE conference. The conference is sponsored by Tsinghua University and co-sponsored by organizations including IEEE Dielectric and Insulation Committee.

“ An Investigation of Harmless Treatment of SF6Adsorbent for Gas Insulated Equipment ” and “ Study on pyrolysis characteristics of high voltage power cable Polyvinyl chloride outer sheath based on Fourier transform infrared spectrometer”

Two academic papers by the aforementioned research group --An Investigation of Harmless Treatment of SF6Adsorbent for Gas Insulated EquipmentandStudy on Pyrolysis Characteristics of High Voltage Power Cable Polyvinyl Chloride Outer SheathBased on Fourier Transform Infrared Spectrometer,were accepted by the proceedings of ICHVE 2020 conference. They reflect the latest work of the research group on environmental treatment of sulphur hexafluoride sorbents in electrical equipment and fault diagnosis in high-voltage cables. Fu Wei and Bai Yichun gave their presentations at the conference and were engaged in active communication with the national and international session chairs and scholars. Their performance was well recognized by the scholars at the conference.

5D46?e=.jpg

Address: No. 20, East University town road, Shapingba district, Chongqing.     Postcode: 401331

Information Management: Publicity Department of Party Committee of CQUST. Technical Support:Information Technology  Office  of CQUST.

Copyright: Chongqing University of Science and Technology. ICP 13000511-1